Test Pattern Generator

Purpose

The Test Pattern Generator and Test Pattern Monitor can be used to test digital audio circuits. They can detect bit errors, which can be, for example, stuck bits or missing bits due to 8/12 bit conversion.

The Test Pattern Generator generates audio input data. The Test Pattern Monitor displays the results received from the generator.

Tips:

• You can check for signal corruption over an XDAB connection by wiring a Test Pattern Generator and a Test Pattern Monitor on either side of an XDAB device.
• You can perform a continual test of the delay memory of a NioNode by wiring a Test Pattern Generator and a Test Pattern Monitor on either side of a Fixed-Point Delay device. Any memory failures will be detected by the Test Pattern Monitor.
• You can use a Test Pattern Generator and Test Pattern Monitor to test an AES connection. You can make the physical connection between the AES cards in two NIONs, or you can create a loopback connection between the connectors on a single card.
• For more complicated tests, we recommend using the PRN generator/verifier.